Metrology Concepts specializes in surface and wavefront measurement solutions for the ophthalmic, precision optics, scientific, laser and defense markets. Core technologies include phase shifting interferometry and Shack-Hartmann wavefront sensing. Working closely with our customers, we offer standard and custom instruments, measurement services, and workforce training.
The company was founded in 2006 following a management buy-out of Fisba Optik's US interferometer subsidiary. We've operated from Rochester, New York since 1998.

See us at SPIE Optifab:

18 -21 October 2027 Rochester, New York Call (585) 427-9155