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Surface and Wavefront Measurement Solutions

Applications Include

Laser Beam Analysis

Collimation of laser diode and LED assemblies

Wavefront analysis of adaptive optics

Contact and IOL measurement

SPDT lathe calibration

Radius of curvature measurement

Sag measurement

Form error of precision planes, spheres and aspheres

Homogeneity of optical material

Transmitted wavefront error of optical assemblies

Zernike and Seidel analysis

CNC and molded optics production monitoring

MTF and PSF analysis

Metrology Concepts LLC
3495 Winton Place   Bldg E-120   Rochester, New York 14623
Tel: (585) 427-9155  Fax: (585) 427-9026  Info@MetrologyConcepts.com